09:00 – 10:00 – Discussion Group: Separation Methods for Polymers (DSP)

11:30 – 12:00 Bastiaan Staal, Basf Ludwigshafen, Germany
The ultimate struggling with GPC-IR. “Krieg oder Sieg”

12:00 – 12:30 Peter Schoenmakers, University of Amsterdam, The Netherlands
Using LCxLC technology to jump ahead

15:00 – 15:30 Mubasher Bashir, Dow Benelux BV Terneuzen, The Netherlands
Characterization of Silicon- and Carbon-Based UHMW Polymers and Inorganic Colloids by AF4-MALS

15:30 – 16:00 Rajesh Chitta, SABIC Bergen op Zoom, The Netherlands
Selective experimental parameters for TREF of propylene-ethylene random copolymers: limiting undercooling of PP

16:00 – 16:30 Alan Brooks, Agilent
New evaporative light scattering detector for high temperature GPC/LC applications.